The Manchester Metallurgical Society (MMS) and The University of Manchester presents:
Advanced Materials Characterisation Techniques at The University of Manchester
- X-ray Computed Tomography
- High-Resolution Digital Image Correlation
- In Situ Scale Testing in the Plasma FIB
- In Situ and Advanced TEM Studies
The evening’s presentations given will provide details of four state-of-the-art characterization techniques in which the Univeristy of Manchester (UoM) retains a world-leading capability. These are as follows:
X-ray computed tomography: Manchester’s Henry-Moseley X-ray Imaging Facility is a world-leading centre for X-ray CT. This talk will describe how the technique can be used to investigate a number of metallurgical
phenomena and features, including void formation in creep testing and ductile fracture, the corrosion of alloys during in situ experiments, and the orientation and packing of grains in 3D space.
(talk delivered by Dr Tom Slater)
High-resolution digital image correlation: HRDIC allows us to measure how metals and alloys deform on the sub-micrometre length scale. The technique, which has been developed at UoM over recent years,
has a resolution approaching 20 nm, such that individual slip bands in samples can be measured. When combined with electron backscatter diffraction (EBSD) and backscattered electron imaging
(specifically electron-channeling contrast imaging - ECCI), it can be used to produce truly remarkable deformation maps of materials. Results so far have revealed a number of unusual and unexpected phenomena.
(talk delivered by Dr Ed Pickering)
In-situ small-scale testing utilizing plasma focused ion beam milling: Many metallurgists will be familiar with the power of focused ion beam (FIB) milling using Ga ions. The plasma FIB instrument at UoM
uses Xe ions and very high milling rates (x10 standard FIB) to enable the production of larger specimens in much shorter periods of time. Rapid cross-sectioning investigations can be carried out on large volumes
(coupled with EDX and EBSD), and it can also be used to create novel samples for small-scale in situ tests in the SEM.
(talk delivered by Albert Smith)
In situ and Advanced TEM studies: UoM hosts one of the largest centres for electron microscopy in the world. We have two advanced analytical transmission electron microscopes, including an FEI Talos
TEM, capable of rapid EDX spectrum imaging and tomography studies, and an aberration-corrected FEI Titan G2 S/TEM, which is capable of high-resolution STEM imaging at the atomic scale.
Over recent years, we have been developing our capabilities to perform novel in situ experiments using our analytical electron microscopes, including in situ corrosion experiments, and these will be explored in this talk.
(talk delivered by Prof Grace Burke)
